Portable X-ray residual stress measurement device (new lineup μ-X360s)
The long-awaited compact version μ-X360s of the μ-X360 series has arrived! Capable of measuring [residual stress], [half-value width], and [residual austenite].
~ Achieving compactness, lightweight design, high-speed measurement, and excellent mobility! ~ The residual stress measurement device has evolved to this point! We have added the long-awaited compact version μ-X360s to the μ-X360 series. It non-destructively measures residual stress, residual austenite, and half-value width in metals and ceramics. It is an outstanding device in terms of portability, reliability, safety, operability, and price.
- Company：パルステック工業
- Price：Other
